|About this Abstract
||2022 TMS Annual Meeting & Exhibition
||Advanced Characterization Techniques for Quantifying and Modeling Deformation
||Investigation of Dislocation Structures in an Al-Li Binary Alloy via High Resolution X-ray Characterization Techniques
||Sven Gustafson, Wolfgang Ludwig, Katherine S Shanks, Carsten Detlefs, Michael D Sangid
|On-Site Speaker (Planned)
During cyclic loading, dislocations accumulate at microstructural features such as grain boundaries and form structures within the interior of individual grains; such structures lead to intragranular variations of elastic strain and orientation. With increasing cycles, these variations lead to potentially large stress/strain gradients and inevitably will affect the fatigue performance of the material. Grain averaged elastic strains were tracked via high energy X-ray diffraction microscopy during high cycle fatigue loading of a polycrystalline, Al-Li binary alloy. Following cyclic loading, individual grain(s) within the bulk of the specimen were further probed by dark field X-ray microscopy, a high-resolution X-ray characterization technique, to characterize the 3D elastic strain and orientation fields around internal dislocation structures. This study will provide new insights of fatigue induced dislocation structures, such as persistent slip bands, in the bulk of polycrystalline materials, which are unable to be captured with standard 2D surface or destructive techniques.