About this Abstract |
Meeting |
5th International Congress on 3D Materials Science (3DMS 2021)
|
Symposium
|
5th International Congress on 3D Materials Science (3DMS 2021)
|
Presentation Title |
New Opportunities in Scanning Intragranular Deformation at the Materials Science Beamline at the ESRF |
Author(s) |
Peter Reischig, Wolfgang Ludwig, Jon Wright |
On-Site Speaker (Planned) |
Jon Wright |
Abstract Scope |
The current ESRF source upgrade is delivering an order of magnitude higher photon flux for the Materials Science beamline, ID11, and, together with newly installed state-of-the-art detectors and control software, this will greatly enhance polycrystal diffraction imaging performance. The “nanoscope” instrument provides a 100nm to 1µm size monochromatic point or line focus beams for single crystal, powder and PDF measurements. Grain boundary and intragranular strain scanning using an adaptive tomographic reconstruction have been demonstrated at submicron spatial and ~10-4 strain resolution. The “3D-XRD microscope” in the same hutch offers point, line or box beam illumination for 3D-XRD to obtain grain average properties in the far-field, and grain boundaries and sub-grain properties in the near-field (via Diffraction Contrast Tomography and Topo- Tomography), as well as phase- and absorption contrast imaging. Novel hardware calibration and reconstruction methods are increasing the sensitivity to intragranular misorientation and strain in the near-field for in-situ studies. |
Proceedings Inclusion? |
Definite: Other |