Abstract Scope |
One advantage of serial-sectioning is the ability to analyze large volumes while maintaining a relatively high resolutions. Additionally, there are multiple imaging modes that can be used for each section surface, allowing for more precise segmentation of features. Here we present a method wherein electron backscattered images are used to resolve pore defects in additively manufactured 316L, while Electron Backscattered Diffraction (EBSD) is used to resolve the grain structure. Due to the high-tilt imaging conditions of the EBSD, the spatial distortions were removed by comparing common features within each of the two datasets and aligning the 3D datasets. This then allowed for co-analysis of the data where we show that small grains are highly correlated with lack of fusion pores within the AM material, indicating that the pores may play a significant role as nucleation sites for new grains during AM processing. |