Author(s) |
Leora Dresselhaus-Cooper, Suzanne Ali, Sean Breckling, Philip Cook, Carsten Detlefs, Jon Eggert, Eric Galtier, Lisseth Gavilan-Marin, Arnulfo Gonzalez, Marylesa Howard, Kento Katagiri, Hyunjung Kim, Sangsoo Kim, Sunam Kim, Sungwon Kim, Sungwook Kim, Stephan Kuschel, Hae Ja Lee, Chuanlong Lin, R. Stewart McWilliams, Daewoong Nam, Norimasa Ozaki, Ricardo Pablo Pedro, Henning Friis Poulsen, Alison Saunders, Frank Schoofs, Toshimori Sekine, Hugh Simons, Bihan Wang, Wenge Yang, Grethe Winthers, Can Yildirim |
Abstract Scope |
A material’s response to its surroundings depends on both its native properties and the imperfections (defects) in its structure. While techniques exist to probe material defects, they are mainly limited to surface measurements or rastered scans that cannot measure the dynamics of irreversible processes. Dark-field X-ray microscopy (DFXM) can now directly image defects in single- and poly-crystals, resolving the lattice tilt and inclination with high sensitivity over long length-scales. We have extended DFXM to synchrotron and X-ray free electron laser experiments to directly image the time evolution of defects in materials—focusing on defects at the mesoscale (e.g. dislocations). These movies resolve the dynamics of defects in single crystals, directly measuring their mobility and interactions by measuring the strain with 10-5 resolution over hundreds of micrometers. With this new tool, I demonstrate how dislocations evolve in aluminum during annealing, and how cumulative radiation damage evolves. Time-resolved DFXM holds important opportunities for future studies on mesoscale dynamics, as it can inform models that have previously been refined only by indirect measurements and multi-scale models. |