|About this Abstract
||2020 TMS Annual Meeting & Exhibition
||Characterization of Minerals, Metals and Materials
||K-61: Determinations of Trace and Ultra-Trace Level Contaminants in Advanced Materials Using Electrothermal Vaporization ICP–OES
||Abbas Fahami, Karol Putyera
|On-Site Speaker (Planned)
The advanced technologies have witnessed a sharply growing demand for developing and using powerful analytical methods for characterizing of trace and ultra-trace level of impurities on different specific properties of materials. We aim to bring in electrothermal vaporization (ETV) coupled with inductively coupled plasma optical emission spectrometry (ICP-OES) as an exceptionally sensitive solid sampling technique for purity verifications of high-performance materials based on carbon, silicon, and silicon carbide. In this study, we demonstrated that ETV-ICP-OES is applicable for determining even low-volatility analytes especially the carbide-forming elements such as Cr, Ti, V, and Zr. Various traceable calibration strategies were used for quantitative chemical analyses. The different powder samples were analyzed and quantified. The accuracy of the results was checked by comparison of other analytical technique, which were in a very good agreement of the other analytical results, but without all inherent risks (sample contaminations or losses) and difficult sample preparation.