|About this Abstract
||2020 TMS Annual Meeting & Exhibition
||Characterization of Minerals, Metals and Materials
||Microstructure Dependent Thermal Conductivity Measurement of Zircaloy-4 using an Extended Raman Thermometry Method
||Hao Wang, Abhijeet Dhiman, Vikas Tomar
|On-Site Speaker (Planned)
In this work, by introducing a thin silicon coating on the sample surface, the Raman thermometry method was extended to metallic sample measurements. A heat transfer model for samples with a thin coating layer was derived. Combining this heat transfer model with the Raman thermometry method, experiments were performed to measure localized spatially resolved thermal conductivity of zircaloy-4 samples.The local thermal conductivity values showed increase with increase in grain size. Nanoindentation based elastic modulus maps showed the exact same location specific variation as the microstructure dependent thermal conductivity variation indicating a possibility that room temperature thermal conductivity in zircaloy-4 is phonon dominated.