|About this Abstract
||2020 TMS Annual Meeting & Exhibition
||Characterization of Minerals, Metals and Materials
||Optical Characterization of Grain Orientation by Directional Reflectance Microscopy
||Bernard Gaskey, Ludwig Hendl, Xiaogang Wang, Matteo Seita
|On-Site Speaker (Planned)
Until now, the characterization of grain orientation or crystallographic texture in polycrystalline metals has been the exclusive domain of diffraction techniques. Directional reflectance microscopy (DRM) is an alternative that seeks to quantify crystallographic orientation optically by correlating optical reflectivity with surface structure. By imaging a sample repeatedly with monodirectional illumination from different angles, a directional reflectance profile can be computed, which contains detailed information about the local surface structure and underlying crystallography. We demonstrate DRM on a variety of metals which have been etched to reveal specific crystallographic facets. By indexing the reflections from these facets, DRM can map orientation in the same way as electron backscatter diffraction (EBSD). With the additional flexibility afforded by high throughput and simple equipment, DRM is a candidate to replace or compliment EBSD in a wide range of research and industrial applications.