|About this Abstract
|Materials Science & Technology 2020
|Integration between Modeling and Experiments for Crystalline Metals: From Atomistic to Macroscopic Scales II
|Electron Backscatter Diffraction Pattern Simulation for Interaction Volume Containing Lattice Defects
|Chaoyi Zhu, Marc De Graef
|On-Site Speaker (Planned)
Despite the existence of numerous experimental studies on lattice defects with EBSD, there exists a lack of systematic understanding of the effects of defects on diffraction patterns. Early studies have shown that backscattered electrons are randomly generated inside the interaction volume, as prescribed by the Rutherford differential scattering cross-section. To accurately account for the effect of spatial distribution and density of defects on the diffraction pattern, interaction volume effect and depth-dependent local distortion of the crystal must be simultaneously considered. In this study, the integration of the approximate model for deformation inclusion in a master pattern with the depth-specific dynamical master pattern simulation allows us to produce a single weighted diffraction pattern summing up all the deformed depth master patterns contained within an interaction volume. Using this new method of pattern simulation, we have examined two cases: 1) a single edge dislocation; 2) a low angle grain boundary.