| About this Abstract |
| Meeting |
2024 TMS Annual Meeting & Exhibition
|
| Symposium
|
Novel Strategies for Rapid Acquisition and Processing of Large Datasets from Advanced Characterization Techniques
|
| Presentation Title |
Directional Reflectance Microscopy: Beyond Conventional Crystal Orientation Mapping |
| Author(s) |
Matteo Seita |
| On-Site Speaker (Planned) |
Matteo Seita |
| Abstract Scope |
Directional reflectance microscopy (DRM) is an optical technique that enables orientation mapping of crystalline surfaces in a similar fashion to conventional diffraction-based methods such as electron backscatter diffraction. DRM involves acquiring a series of optical micrographs of chemically etched solids under variable illumination angle. By analyzing the angle-dependent reflectivity of the surface, it is possible to compute the local crystal orientation at a spatial and angular resolution of ~5 µm and ~5°, respectively. Besides the reduced cost of the hardware and the simplified sample preparation compared to conventional methods, DRM offers unparalleled capabilities to map crystal orientation on the curved surface of life-sized engineering components. These features make DRM a candidate characterization technique for in-line quality control and microstructure digitization across the industry. |
| Proceedings Inclusion? |
Planned: |