Ceramic processing is the foundation of all ceramic manufacturing processes, but defects generated during processing can limit component performance. If we think like a particle, we can envision the particle environment and anticipate problems. Conversely, fractography of fracture surface can provide insight into the root cause for failure. The obvious opportunity is to identify the fracture origin, but within that context it may be possible to identify at what point in the overall process the defect was generated. For example, a free-sintered surface with a crescent moon shape may indicate polymer compatibility, whereas a small cluster of poorly sintered particles would suggest the insufficient elimination of agglomerates. In this context, if we think like a defect, we should be able to identify precisely the point in the process that the defect was generated.