|About this Abstract
||MS&T23: Materials Science & Technology
||Manufacturing and Processing of Advanced Ceramic Materials
||Manipulating Instrument Setup Parameters to Increase the Range for Particle Size Measurement
||Emelia Enke, Daniel Delia, Hyojin Lee, William Carty
|On-Site Speaker (Planned)
Statistical models can be used to detect agglomeration in fine particle systems. For nano-scale particles (D50 <100nm) only laser scattering techniques are available, but these techniques are unreliable because they require the real and imaginary components of the refractive index and the algorithms used to calculate a particle size are proprietary. We propose that the only reliable method for obtaining particle size data is the X-Ray sedimentation instrument that invokes Stokes sedimentation behavior, but instrument software limitations limit measurement to 100 nm, under an incorrect assumption that Brownian Motion will inhibit sedimentation. By manipulating the instrument setup parameters, we have been able to reliably particle size measurement to 10 nm, and the statistical models remain valid. We have not observed the Brownian Motion cutoff, as of the writing of this abstract. The only drawback of this approach is that extremely long measurement times are required, approaching 24 hours.