||Fan Zhang, National Institute of Standards and Technology
Tom James Stockman, Los Alamos National Laboratory
Tao Sun, University of Virginia
Donald W. Brown, Los Alamos National Laboratory
Yan Gao, Ge Research
Amit Pandey, MicroTesting Solutions
Joy Gockel, Wright State University
Tim Horn, North Carolina State University
Sneha Prabha Narra, Worcester Polytechnic Institute
Judy Schneider, University of Alabama at Huntsville
||Additive manufacturing (AM) technologies represent a fast-growing manufacturing domain and are adopted into increasingly demanding industry-driven applications. AM is unique in that the material is built at the same time as the component. The nonequilibrium nature of the AM processes introduces highly heterogeneous microstructure across multiple length scales. A proper understanding of the properties and behaviors of AM materials, including the build process, presents a major characterization challenge to the construction of the processing-structure-performance relationship of the final product and to the certification of materials with predictable materials properties.
This symposium focuses on the application of advanced characterization techniques in AM materials. It has two main themes. The first theme emphasizes characterization of AM materials using facility-based, state-of-the-art synchrotron and neutron characterization techniques. Abstracts are requested in, but not limited to, the following areas:
1. Time-resolved imaging and diffraction of the AM process
2. Structure and microstructure evolution during post-build heat treatment
3. Residual stress measurements and their model validation
4. Spatially resolved measurements at different length scales, including microdiffraction and microtomography
5. Mechanical behavior characterization, including deformation, fatigue, and fracture
The second theme emphasizes in situ characterization and diagnostics using laboratory-scale techniques. Abstracts are requested in, but not limited to, the following areas:
1. Advancement of existing and emerging in situ monitoring and control techniques to expose process phenomenon, detect material quality, and control process variation.
2. Identification and understanding of the formation of inherent defects and process anomalies during fabrication from laboratory-scale research to industrial-scale implementation.
We also welcome abstracts addressing industrial applications and industrial perspective on characterization needs, as well as theoretical modeling and numerical simulations that are validated by synchrotron, neutron, or laboratory-scale in situ measurements.
The purpose of this symposium is to provide a forum to review and discuss studies of the processing, structure, and properties of AM materials using these advanced characterization techniques. We believe that extensive application of these techniques, in combination with modeling and simulations, will lead to major breakthroughs in understanding of the AM materials and their processing at a fundamental level within the foreseeable future, bridge the knowledge gap between academia and industry, and contribute to the development of AM technology and industrial innovation.