About this Abstract |
Meeting |
2020 TMS Annual Meeting & Exhibition
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Symposium
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Additive Manufacturing: Advanced Characterization with Synchrotron, Neutron, and In Situ Laboratory-scale Techniques
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Presentation Title |
In-situ Characterization of Laser Additive Manufacturing Process Using High-speed Synchrotron X-ray Diffraction |
Author(s) |
Chihpin Chihpin Chuang, Peter Kenesei, Jun-Sang Park, Tao Sun, Cang Zhao, Niranjan Dilip Parab, Yan Gao, Xuan Zhang, Anthony Rollett, Jonathan Almer |
On-Site Speaker (Planned) |
Chihpin Chihpin Chuang |
Abstract Scope |
Rapid melting and solidification during laser Additive Manufacturing (AM) process create unique microstructure that is distinct comparing to other traditional metal processing techniques. Advanced characterization tools are needed to explore the relevant temporal and thermal process regimes. In this work, we will discuss recent development in in-situ characterization capabilities at beamline 1-ID of the Advanced Photon Source that aims to better understand the effect of rapid heating and solidification on the microstructural features of engineering alloys and correlate those to AM process parameters. We utilized focused high-energy X-ray beam and a high frame rate CdTe detector to acquire position-dependent structure information around the laser scan path. The experiment demonstrates that the laser melting processes can be monitored through high-energy diffraction experiment and obtain information regarding crystal structure, phase and temperature evolution, and precipitates formation. The limitation of the current setup and the future development will also be discussed. |
Proceedings Inclusion? |
Planned: Supplemental Proceedings volume |