About this Abstract |
Meeting |
2020 TMS Annual Meeting & Exhibition
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Symposium
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Additive Manufacturing: Advanced Characterization with Synchrotron, Neutron, and In Situ Laboratory-scale Techniques
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Presentation Title |
A-22: Characterizing the Deformation in Single Cell Ti-5553 Lattice Structures |
Author(s) |
Maria Strantza, Nathan S. Johnson, Donald W. Brown, Jenny Wang, Jefferson A. Cuadra, David J. Macknelly, John S. Carpenter, Manyalibo J. Matthews |
On-Site Speaker (Planned) |
Maria Strantza |
Abstract Scope |
Additive manufacturing (AM) brings new possibilities to the production of lightweight, high stiffness lattice structures with various densities. The load bearing properties, the strength-to-weight ratio and the tailored shock absorption are the main mechanical benefits of the lattice structures. However, their deformation behavior is complex and challenging to be predicted. In this investigation, we perform in-situ diffraction experiments during the deformation of Ti-5553 lattice structures using synchrotron X-ray diffraction. Prior to the in-situ diffraction experiments, the density of the AM samples was characterized using CT imaging. Our aim is to use the lattice parameter of the material in order to understand the behavior of single cell lattice structures under compression, which will permit improved design optimization of the lattice structures for specific applications. Our results are also used to validate computational models for the prediction of the deformation behavior of the lattice structures. Prepared by LLNL under Contract DE-AC52-07NA27344. |
Proceedings Inclusion? |
Planned: Supplemental Proceedings volume |