About this Abstract |
Meeting |
2020 TMS Annual Meeting & Exhibition
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Symposium
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Additive Manufacturing: Advanced Characterization with Synchrotron, Neutron, and In Situ Laboratory-scale Techniques
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Presentation Title |
The Important Contribution of Synchrotron X-ray and Neutron Measurements to Metal Additive Manufacturing Benchmarks |
Author(s) |
Lyle E. Levine, Fan Zhang, Thien Phan, Maria Strantza, Bjorn Clausen, Donald Brown, Darren Pagan, Andrew Allen, Jan Ilavsky |
On-Site Speaker (Planned) |
Lyle E. Levine |
Abstract Scope |
The Additive Manufacturing Benchmark Test Series (AM-Bench) is a continuing series of highly controlled benchmark measurements for additive manufacturing that allows modelers to test their simulations against rigorous additive manufacturing benchmark test data. AM-Bench aims to provide high-fidelity sets of coordinated in situ and ex situ measurements and process data, covering the full range from feedstock material to finished part. The unique capabilities afforded by synchrotron X-ray and neutron instruments have provided invaluable information on aspects such as spatially-resolved elastic strains and stresses within the as-built parts, evaluations of the alloy phases and elemental segregation, and in situ measurements of the growth of precipitates during post-build heat treatments. These measurements were conducted at the NIST Center for Neutron Research, the Cornell High Energy Synchrotron Source, and three beamlines at the Advanced Photon Source. Future benchmark measurements are expected to expand upon the use of synchrotron X-ray and neutron measurements. |
Proceedings Inclusion? |
Planned: Supplemental Proceedings volume |