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Meeting MS&T23: Materials Science & Technology
Symposium Materials Informatics for Images and Multi-dimensional Datasets
Presentation Title Nanoscale Metrology of Materials Studied by Advanced Electron Microscopy Imaging and Spectroscopy.
Author(s) Nasim Alem
On-Site Speaker (Planned) Nasim Alem
Abstract Scope While the macroscale properties of materials are directly controlled by their atomic and chemical structure, it is imperative to determine and quantitatively access how the microstructural variations arise from synthesis/processing and the macroscale properties they lead to. Electron microscopy imaging and spectroscopy is a powerful technique that provides an insight into the local atomic and electronic structure of materials. Using advanced data analysis and machine learning algorithms, it is possible to extract valuable information about the local atomic and chemical state within the matrix, and near the interfaces and defects, in multi-dimensional datasets. In this talk, we will present our recent work on the quantification of the microstructure, local structural distortions, and valence state, in a wide range of materials, such as oxides and 2D crystals, using advanced data analysis and machine learning algorithms.

OTHER PAPERS PLANNED FOR THIS SYMPOSIUM

Efficient Void Shape Optimization Using Deep Generative Convolutional Neural Networks
Informing Autonomous Processing via STEM-EELS Using Variational Autoencoders for Classification and Decision
Machine Learning Segmentation Methods for Fatigue Fracture Surface Defect Analyses
Microstructure Statistics for Property Prediction in Multifunctional Electrode Composites Using Random Forests
Multi-modal Image Registration for Materials Characterization
Nanoscale Metrology of Materials Studied by Advanced Electron Microscopy Imaging and Spectroscopy.
Out-of-Domain Prediction of Material Property Using Deep Learning
Phase Segmentation of Steel Microstructures via Semi Supervised Deep Learning
Predicting the Occurrence and Mechanism of Liquid Metal Embrittlement Using Machine Learning
Rapid Grain Segmentation From Grayscale Micrograph Through Computer Vision Method
Semi-automated Hierarchical Clustering Model for 4D-STEM Datasets
Structure-property Relationships Derived From Electron Microscope to Atomistic Simulations
The Conundrum of Ambiguous Feature Sets in Materials Informatics for Images
Topic Modelling Framework for Rapid Digestion of Additive Manufacturing Literature
Using Computer Vision to Cluster Fatigue Life Based on Small Crack Characteristics

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