ProgramMaster Logo
Conference Tools for MS&T23: Materials Science & Technology
Login
Register as a New User
Help
Submit An Abstract
Propose A Symposium
Presenter/Author Tools
Organizer/Editor Tools
About this Abstract
Meeting MS&T23: Materials Science & Technology
Symposium Materials Informatics for Images and Multi-dimensional Datasets
Presentation Title Informing Autonomous Processing via STEM-EELS Using Variational Autoencoders for Classification and Decision
Author(s) Jonathan Hollenbach, Mitra L Taheri
On-Site Speaker (Planned) Jonathan Hollenbach
Abstract Scope In-situ Electron Energy Loss Spectroscopy (EELS) is an instrumental technique in understanding how processing materials changes local structure and composition, but acting on the transient changes occurring at high temporal resolutions requires new artificial intelligence frameworks for characterization and analysis to match the data rate of the detector. We demonstrate a machine learning framework for rapid assessment and characterization of operando EELS data, informing decision frameworks and updating process changes. Variational Autoencoders (VAEs) have been proven ideal for encoding the complex relations of chemical changes to latent representations. These tools are paired with automation tools controlling the instrument and specialty in-situ stages to enact precise driving forces on the sample. We explore how latent encodings are used as basis for classification against theoretical structures and as inputs for decision frameworks to control autonomous experiments within the Transmission Electron Microscope (TEM).

OTHER PAPERS PLANNED FOR THIS SYMPOSIUM

Efficient Void Shape Optimization Using Deep Generative Convolutional Neural Networks
Informing Autonomous Processing via STEM-EELS Using Variational Autoencoders for Classification and Decision
Machine Learning Segmentation Methods for Fatigue Fracture Surface Defect Analyses
Microstructure Statistics for Property Prediction in Multifunctional Electrode Composites Using Random Forests
Multi-modal Image Registration for Materials Characterization
Nanoscale Metrology of Materials Studied by Advanced Electron Microscopy Imaging and Spectroscopy.
Out-of-Domain Prediction of Material Property Using Deep Learning
Phase Segmentation of Steel Microstructures via Semi Supervised Deep Learning
Predicting the Occurrence and Mechanism of Liquid Metal Embrittlement Using Machine Learning
Rapid Grain Segmentation From Grayscale Micrograph Through Computer Vision Method
Semi-automated Hierarchical Clustering Model for 4D-STEM Datasets
Structure-property Relationships Derived From Electron Microscope to Atomistic Simulations
The Conundrum of Ambiguous Feature Sets in Materials Informatics for Images
Topic Modelling Framework for Rapid Digestion of Additive Manufacturing Literature
Using Computer Vision to Cluster Fatigue Life Based on Small Crack Characteristics

Questions about ProgramMaster? Contact programming@programmaster.org