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Meeting MS&T23: Materials Science & Technology
Symposium Materials Informatics for Images and Multi-dimensional Datasets
Presentation Title Structure-property Relationships Derived From Electron Microscope to Atomistic Simulations
Author(s) Ayana Ghosh
On-Site Speaker (Planned) Ayana Ghosh
Abstract Scope With the emergence of efficient algorithms and advancement in electron microscopes, there is a scope to utilize theoretical models to guide, perform experiments while refining the parameters in both spaces, to establish a continuous feedback-loop. Instrument specificity, implementation complexity, information transferability by addressing fundamentally different latencies of imaging and simulations, remain the primary challenges. This presentation will focus on how deep learning (DL) frameworks are employed to extract atomic level information from 2D systems such as graphene followed by first-principles based studies to develop comprehensive understanding of the materials physics. These enable seamless deployment of several DL algorithms on-the-fly for appropriate feature finding, property predictions in combination with atomistic simulations to explore underpinning causal mechanisms, suited for guiding next set of experiments.

OTHER PAPERS PLANNED FOR THIS SYMPOSIUM

Efficient Void Shape Optimization Using Deep Generative Convolutional Neural Networks
Informing Autonomous Processing via STEM-EELS Using Variational Autoencoders for Classification and Decision
Machine Learning Segmentation Methods for Fatigue Fracture Surface Defect Analyses
Microstructure Statistics for Property Prediction in Multifunctional Electrode Composites Using Random Forests
Multi-modal Image Registration for Materials Characterization
Nanoscale Metrology of Materials Studied by Advanced Electron Microscopy Imaging and Spectroscopy.
Out-of-Domain Prediction of Material Property Using Deep Learning
Phase Segmentation of Steel Microstructures via Semi Supervised Deep Learning
Predicting the Occurrence and Mechanism of Liquid Metal Embrittlement Using Machine Learning
Rapid Grain Segmentation From Grayscale Micrograph Through Computer Vision Method
Semi-automated Hierarchical Clustering Model for 4D-STEM Datasets
Structure-property Relationships Derived From Electron Microscope to Atomistic Simulations
The Conundrum of Ambiguous Feature Sets in Materials Informatics for Images
Topic Modelling Framework for Rapid Digestion of Additive Manufacturing Literature
Using Computer Vision to Cluster Fatigue Life Based on Small Crack Characteristics

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