ProgramMaster Logo
Conference Tools for MS&T23: Materials Science & Technology
Login
Register as a New User
Help
Submit An Abstract
Propose A Symposium
Presenter/Author Tools
Organizer/Editor Tools
About this Abstract
Meeting MS&T23: Materials Science & Technology
Symposium Materials Informatics for Images and Multi-dimensional Datasets
Presentation Title Multi-modal Image Registration for Materials Characterization
Author(s) Zachary Varley, Marc De Graef, Gregory Rohrer, Megna Shah, Sean Donegan, Michael Uchic
On-Site Speaker (Planned) Zachary Varley
Abstract Scope Big data techniques are revolutionizing materials science research by enabling the analysis of large volumes of often disparate data, including images. Image registration is a critical task in many big data pipelines, involving multiple imaging modalities. Traditionally, local optimization approaches have been used for image registration, but we propose a novel approach based on image entropy filters and key point matching. Our key point detector approach is inspired by the difference of Gaussians (DoG) method, while our key point descriptors are based on the scale-invariant feature transform (SIFT). We demonstrate the effectiveness of our approach in the SEM, where planar homographies underpin many registration problems. Our method offers a promising solution for automating the collation of multi-modal data, facilitating informatics-based approaches to improve our understanding of materials structure and properties.

OTHER PAPERS PLANNED FOR THIS SYMPOSIUM

Efficient Void Shape Optimization Using Deep Generative Convolutional Neural Networks
Informing Autonomous Processing via STEM-EELS Using Variational Autoencoders for Classification and Decision
Machine Learning Segmentation Methods for Fatigue Fracture Surface Defect Analyses
Microstructure Statistics for Property Prediction in Multifunctional Electrode Composites Using Random Forests
Multi-modal Image Registration for Materials Characterization
Nanoscale Metrology of Materials Studied by Advanced Electron Microscopy Imaging and Spectroscopy.
Out-of-Domain Prediction of Material Property Using Deep Learning
Phase Segmentation of Steel Microstructures via Semi Supervised Deep Learning
Predicting the Occurrence and Mechanism of Liquid Metal Embrittlement Using Machine Learning
Rapid Grain Segmentation From Grayscale Micrograph Through Computer Vision Method
Semi-automated Hierarchical Clustering Model for 4D-STEM Datasets
Structure-property Relationships Derived From Electron Microscope to Atomistic Simulations
The Conundrum of Ambiguous Feature Sets in Materials Informatics for Images
Topic Modelling Framework for Rapid Digestion of Additive Manufacturing Literature
Using Computer Vision to Cluster Fatigue Life Based on Small Crack Characteristics

Questions about ProgramMaster? Contact programming@programmaster.org