| About this Abstract |
| Meeting |
MS&T23: Materials Science & Technology
|
| Symposium
|
Advanced Characterization of Materials for Nuclear, Radiation, and Extreme Environments IV
|
| Presentation Title |
Probing Nanoscale Properties of Radioactive Material by Advanced Correlative Microscopy |
| Author(s) |
Shawn Lee Riechers, Joshua A Silverstein, Andrew M Casella |
| On-Site Speaker (Planned) |
Shawn Lee Riechers |
| Abstract Scope |
Understanding and predicting radiation induced changes in materials has been greatly advanced by characterization at the micrometer to atomic scale, primarily by electron microscopy techniques. However, the effect these changes have on material properties are often measured in bulk at the dozens of micrometers to cm scale. Atomic force microscopy based measurements bridge this gap by providing material properties such as hardness, thermal conductivity, piezo response, etc. with nanometer resolution and can be directly correlated to EM based measurements of the same region. The ability to characterize highly radioactive materials at this scale provides a unique capability to understand fundamental properties of nuclear materials, the effects of radiation induced damage, and ultimately their impact on performance. Comparisons of cladding hardness, pre and post irradiation, and hydrided Zircaloy-4 correlated with EM analysis will be demonstrated. In addition, methods for calibration and comparison with standard material property measurements will be discussed. |