| Abstract Scope |
In situ mechanical testing using transmission electron microscopy (TEM) is a powerful experimental technique to investigate the relationship between microstructural evolution and mechanical stimulation, which originates from the materials strength of matter. In recent years, small and precise loading devices developed based on microelectro-mechanical system (MEMS) technology have been used as an advanced loading system for in situ TEM observations. Here, we report local atomic behavior upon deformation and fracture phenomena in crystalline materials by atomic-resolution in situ TEM observations using a MEMS loading device. The opening displacement in mode I was applied for a SrTiO3 sample with a notch. Different phenomena, crack propagation and dislocation emission from the bottom of the notch, were observed depending on the crystal orientation of the sample. In the presentation, we will discuss these phenomena at the atomic level in detail. |