About this Abstract |
Meeting |
2024 Annual International Solid Freeform Fabrication Symposium (SFF Symp 2024)
|
Symposium
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2024 Annual International Solid Freeform Fabrication Symposium (SFF Symp 2024)
|
Presentation Title |
In-Situ Print Layer Height Correction Framework for Wire Arc Additive Manufacturing |
Author(s) |
Wei Sheng Lim, Siddharth Ganesh, Gim Song Soh |
On-Site Speaker (Planned) |
Wei Sheng Lim |
Abstract Scope |
Wire arc additive manufacturing (WAAM) is a form of layered manufacturing method which relies on predictable deposition of weld beads layers upon layers to form a final part. Within a layer, utilization of variable bead width toolpath planning has been shown to produce geometrically accurate void free shape. However, due to the inherit variability of the WAAM process, print height deviations can still occur which causes uneven surface deposition within a layer. Without intervention, this error would stack with each layer and lead to print failure. To overcome this issue, a variable bead width and height process control framework was developed. This approach utilizes a profile sensor to determine the height variation of a print layer and correct for the height difference at the next layer toolpath using a regression based bead-width process parameter model. An example part is printed to test and verify the feasibility of the framework. |
Proceedings Inclusion? |
Definite: Post-meeting proceedings |