| About this Abstract |
| Meeting |
MS&T24: Materials Science & Technology
|
| Symposium
|
Grain Boundaries, Interfaces, and Surfaces: Fundamental Structure-Property-Performance Relationships
|
| Presentation Title |
Abnormal Grain Growth in Metallic Thin Films Under High Cyclic Loading |
| Author(s) |
Yichen Yang, Qiushi Li, Alejandro Barrios, Yazhuo Liu, Manish Jain, Brad Boyce, Ting Zhu, Olivier N. Pierron |
| On-Site Speaker (Planned) |
Olivier N. Pierron |
| Abstract Scope |
This presentation describes a microelectromechanical system (MEMS) based setup to investigate grain growth in ultrafine grained and nanocrystalline metallic thin films under high/very high cycle loading conditions (i.e., up to 10^9 cycles). The advantage of the technique is that it can test different metals under identical loading conditions and allows in situ electron back-scattered diffraction (EBSD) measurements to get grain orientation. The governing hypothesis is that abnormal grain growth occurs under this loading regime, and that the family of growing grains is mainly dictated by elastic anisotropy. Our results on Au, Al, Ni, and Pt thin films are compared to our previous work on ultrafine grained Ni. Abormal grain growth in Au, Ni, and Pt is observed, but not in Al. The experimental results can be compared to micromechanics analyses and phase-field modeling, in order to better understand the origins of the thermodynamic driving force. |