About this Abstract |
Meeting |
2020 TMS Annual Meeting & Exhibition
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Symposium
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Characterization: Structural Descriptors, Data-Intensive Techniques, and Uncertainty Quantification
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Presentation Title |
Neural Networks for Real-time Processing of Scanning Transmission Electron Microscopy Data |
Author(s) |
James M. LeBeau |
On-Site Speaker (Planned) |
James M. LeBeau |
Abstract Scope |
In this talk, I will discuss our recent work implementing deep convolutional neural networks to autonomously quantify electron diffraction and image data. I will discuss how the network was trained to automatically calibrate the zero-order diffraction disk size, locate the center, and determine pattern rotation without the need for other data pretreatment. The performance of the network to measure sample thickness and tilt will be explored as a function of a variety of variables including thickness, tilt, and dose. The processing speed will also shown to outpace a least squares approach by orders of magnitude. We will also discuss the generality of the method to other materials/orientations as well as a hybrid approach that combines the features of the neural network with least squares fitting for even more robust analysis. |
Proceedings Inclusion? |
Planned: Supplemental Proceedings volume |