About this Abstract |
Meeting |
2020 TMS Annual Meeting & Exhibition
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Symposium
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Characterization: Structural Descriptors, Data-Intensive Techniques, and Uncertainty Quantification
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Presentation Title |
Large-scale Defect Contrast Simulations for Scanning and Transmission Electron Microscopy |
Author(s) |
Marc J. De Graef |
On-Site Speaker (Planned) |
Marc J. De Graef |
Abstract Scope |
Transmission electron microscopy (TEM) has for several decades been the tool of choice for the study of lattice defects such as dislocations and stacking faults. In recent years, electron channeling contrast imaging in the scanning EM (SEM) has provided access to surface penetrating defects. Defect image contrast simulations, on the other hand, have not kept up with the experimental capabilities in the sense that they have only been possible for simple defect geometries, e.g., straight dislocations in an infinite sample. In this presentation, we will review recent advances in the incorporation of defect displacement fields generated by molecular dynamics simulations, phase field simulations, and discrete dislocation dynamics simulations into the electron dynamical scattering formalism. We will review briefly the theory of image formation for TEM and SEM, and provide examples of image simulations for a number of realistic defect configurations generated by these simulation approaches. |
Proceedings Inclusion? |
Planned: Supplemental Proceedings volume |