About this Abstract |
Meeting |
2020 TMS Annual Meeting & Exhibition
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Symposium
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Characterization: Structural Descriptors, Data-Intensive Techniques, and Uncertainty Quantification
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Presentation Title |
A New Crystallographic Defect Quantification Workflow via Advanced-microscopy-based Deep Learning |
Author(s) |
Yuanyuan Zhu, Graham Roberts, Rajat Sainju, Colin Ophus, Brian Hutchinson, Danny Edwards, Mychailo Toloczko |
On-Site Speaker (Planned) |
Yuanyuan Zhu |
Abstract Scope |
Crystallographic defects, in particular dislocations, voids and precipitates are critical to the bulk physical and mechanical properties of metals and alloys. Transmission electron microscopy (TEM) is a standard tool for defect characterization at the nanometer scale, however, quantitative analysis of enough TEM images to provide a statistically satisfactory representation of these defects over a range of synthesis and deformation conditions can often be a time-consuming daunting task. In this talk, we propose a new workflow of high-throughput defects analysis demonstrated using a HT-9 martensitic steels. One unique advancement of our approach involves systematic improvement in all three key steps, including the development of a high-clarity defect imaging technique free of bend contour, a novel convolutional neural network (CNN) model-the MetalDefectNet-for defect identification, and a dedicated MATLAB algorithm for defect quantification. We envision that this new workflow can provide a more reliable and statistically meaningful experimental foundation for metallurgy. |
Proceedings Inclusion? |
Planned: Supplemental Proceedings volume |