About this Abstract |
Meeting |
TMS Specialty Congress 2024
|
Symposium
|
2nd World Congress on Artificial Intelligence in Materials & Manufacturing (AIM 2024)
|
Presentation Title |
Optical to Scanning Electron Microscopy Style Transfer of Steel Micrograph Using Machine Learning |
Author(s) |
Nicholas Amano, Bo Lei, Martin Müller, Dominik Britz, Elizabeth Holm |
On-Site Speaker (Planned) |
Nicholas Amano |
Abstract Scope |
Observation and analysis of microstructure is fundamental to metallurgical science, hence significant resources are allocated towards preparing and imaging structured materials. We present two methods of generating scanning electron microscopy(SEM) images from optical micrographs to reduce imaging requirements and better understand microstructural behavior. This work is made possible by a unique dataset of optical and SEM micrographs collected at identical locations and length scales. We use generative adversarial networks(GANs) and diffusion-based models for style transfer of steel optical micrographs to SEM micrographs. This work reduces the etching and measurement times associated with SEM. Additionally, understanding how the models perform with differing amounts of prior SEM knowledge sheds light on indicators of microstructural outcomes. We demonstrate that both models produce plausible microstructures but share a difficulty with orientation specific recreations. GANs perform well on in-domain recreations, while diffusion models are better suited for generalized micrograph style transfer. |
Proceedings Inclusion? |
Definite: Other |