About this Abstract |
Meeting |
TMS Specialty Congress 2024
|
Symposium
|
2nd World Congress on Artificial Intelligence in Materials & Manufacturing (AIM 2024)
|
Presentation Title |
Semantic Segmentation of Scanning Electron Microscopy Images for Contact Degradation Analysis in Field-aged Photovoltaic Modules |
Author(s) |
Andrew M. Ballen, Max Liggett, Dylan J. Colvin, Pawan Tripathi, Roger French, Kristopher O. Davis, Mengjie Li, Dana Kern |
On-Site Speaker (Planned) |
Max Liggett |
Abstract Scope |
In the context of photovoltaics (PV) research, characterizing the front contact metallization is an integral part of understanding the performance, reliability, and durability of PV cells and modules. A common approach to evaluate PV front contacts is to obtain cross-sectional scanning electron microscopy (SEM) images and make qualitative observations on the quality of bulk, metal contact, interfacial glass fit, and the distribution of metal crystallites. We propose a novel way to objectively and quantitatively observe contact corrosion in silicon-based PV devices using cross-sectional SEM images. The approach uses semantic segmentation to isolate the various parts of the metal contact and its interface to the underlying semiconductor absorber. Then, a statistical analysis of the pixel intensity distribution is performed on specified regions known to correspond to contact corrosion. This approach is applied to various silicon-based PV devices at various states of disrepair due to different levels of exposure to environmental stressors. |
Proceedings Inclusion? |
Definite: Other |