|About this Abstract
|2022 TMS Annual Meeting & Exhibition
|Late News Poster Session
|L-54: Correlative Microscopy and Applied Statistics – Development of a Simultaneous Electron Diffraction and Energy Dispersive X-ray Spectroscopy Data Analysis Method to Understand Interface Populations
|Christopher Bilsland, Andrew Barrow, Ben Britton
|On-Site Speaker (Planned)
Engineering materials often consist of multiple phases that link together to form the underlying microstructure. The phases can have different structures and chemistries, and these are often connected. Manufacturing metallic materials determines the hierarchy of these structures, ranging across the mm to nm length scales, which ultimately determine components properties and lifetime. In this work, we apply simultaneous EBSD (electron backscatter diffraction) and EDS (energy dispersive x-ray spectroscopy) in a SEM (scanning electron microscope) which collects significant amounts of microstructural information. We use correlative processing of this data to yield quantitative results, that can be analysed using common statistical treatments (e.g. ANOVA) to understand systematic variation of the distribution of chemistry and structure within the hierarchical microstructure of wrought and HIP-ed powder metallurgy based nickel alloys. We have applied this method to understand the impact that sample size has on the inspected chemistry of precipitation in these material systems.
|Characterization, Copper / Nickel / Cobalt, Other