About this Abstract |
Meeting |
2022 TMS Annual Meeting & Exhibition
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Symposium
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Seeing is Believing -- Understanding Environmental Degradation and Mechanical Response Using Advanced Characterization Techniques: An SMD Symposium in Honor of Ian M. Robertson
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Presentation Title |
Incorporating Dislocations into the Simulation of EBSD Patterns |
Author(s) |
Marc J. De Graef |
On-Site Speaker (Planned) |
Marc J. De Graef |
Abstract Scope |
Electron Back-Scatter Diffraction (EBSD) has for nearly three decades been used primarily to acquire orientation information in polycrystalline/polyphase materials, during the last decade also in 3D serial sectioning experiments. The closely related Electron Channeling Contrast Imaging (ECCI) technique can image near-surface defects, but it is unclear if EBSD patterns can be used similarly. The high resolution cross-correlation approach can determine strain fields with high accuracy, so there is defect information in an EBSD pattern. We present a novel approach to the simulation of EBSD patterns for crystalline materials that contain near-surface defects. The approach is beased on physics-based forward models for pattern formation but incorporates the defect displacement field as well as the electron beam interaction volume. We will present examples of single dislocation "imaging" as well as the effect of multiple dislocations on pattern sharpness. Preliminary results for displacement fields from discrete dislocation dynamics will be shown. |
Proceedings Inclusion? |
Planned: |
Keywords |
Characterization, Modeling and Simulation, |