|About this Abstract
||2022 TMS Annual Meeting & Exhibition
||Seeing is Believing -- Understanding Environmental Degradation and Mechanical Response Using Advanced Characterization Techniques: An SMD Symposium in Honor of Ian M. Robertson
||In Situ TEM with Ion Irradiation at the IVEM-Tandem: Past, Present and Future
||Meimei Li, Mark Kirk, Wei-Ying Chen, Pete Baldo, Richard Sisson
|On-Site Speaker (Planned)
The IVEM-Tandem Facility consists of an intermediate voltage electron microscope (IVEM) interfaced to a 2 MV tandem ion accelerator and a 650 KV ion implanter. It provides a unique capability for real-time imaging of defects introduced in situ by ion beam irradiation/implantation. It has been used for a wide range of in situ TEM studies of defect dynamics to understand the fundamental mechanisms of defect formation, agglomeration, annihilation, and interactions. The recent addition of a low-energy ion source allows simultaneous low-energy helium implantation and high-energy heavy ion irradiation, to study the interaction of helium effect and cascade displacement damage. The current effort is to apply machine learning/artificial intelligence for computer vision-assisted, automated analysis of in situ video data to achieve real-time defect imaging and real-time defect analysis, and active learning for real-time predictions to assist on-the-fly decision making to guide subsequent experiments.