About this Abstract |
Meeting |
2023 TMS Annual Meeting & Exhibition
|
Symposium
|
Characterization of Minerals, Metals and Materials
|
Presentation Title |
X-ray Tomography as a 3D Metrology Technique |
Author(s) |
Brian M. Patterson, Bryan K Hunter, Steven G Young, Theresa Quintana, Thomas Day, Derek Schmidt, Adam Wachtor |
On-Site Speaker (Planned) |
Brian M. Patterson |
Abstract Scope |
The 3D imaging of materials using X-ray tomography is a powerful technique to understand the interior of materials and their defects. No other technique can be used to non-destructively examine voids, cracks, or inclusions, and is useful for a variety of material systems including polymers, metals, 3D printed, or machined parts. The acquisition of a 3D image of the material is a complicated multi-step process in which a variety of conditions can greatly affect the final image and can make quantification of any features complicated. Each of these steps often rely on decisions by the scientist which affect their accuracy and precision. Here, we will discuss a variety of material systems in which we attempt to quantify surface quality, thin shelled objects, and 3D printed foams dimensions. It is critical to understand the process, assure the numerical validity and that the associated error is as small as possible. |
Proceedings Inclusion? |
Planned: |
Keywords |
Additive Manufacturing, Characterization, Polymers |