About this Abstract |
Meeting |
2023 TMS Annual Meeting & Exhibition
|
Symposium
|
Characterization of Minerals, Metals and Materials
|
Presentation Title |
On the Feasibility of Back-scattered or Ion-induced Secondary Electron Imaging to Determine Grain Orientations |
Author(s) |
Marc J. De Graef |
On-Site Speaker (Planned) |
Marc J. De Graef |
Abstract Scope |
Electron backscatter diffraction (EBSD) is a standard microstructure characterization technique used to determine grain orientations over a region of interest. The experimental scan is performed in a serial fashion, one sampling point at a time. Other observation modalities in the scanning electron microscope, e.g. backscattered electron (BSE) imaging and ion-induced secondary electron (ISE) imaging, are comparatively much faster than an EBSD scan, which raises the question of whether or not these techniques can be used to acquire orientation information. In this contribution we will analyze how the experimental parameters (e.g., number of images at different sample tilts) affect the orientation accuracy of both BSE and ISE imaging approaches using physics-based forward models for both modalities. The combination of BSE/ISE imaging with dictionary matching for individual image pixel intensity profiles may result in a fast large area orientation determination with sufficient orientation accuracy to be competitive with the EBSD approach. |
Proceedings Inclusion? |
Planned: |
Keywords |
Characterization, Modeling and Simulation, |