| About this Abstract |
| Meeting |
2022 TMS Annual Meeting & Exhibition
|
| Symposium
|
Mechanical Behavior at the Nanoscale VI
|
| Presentation Title |
NOW ON-DEMAND ONLY – Measuring and Understanding Nanoscale Adhesion and Deformation Using Iin Situ Experiments in a Transmission Electron Microscope |
| Author(s) |
Tevis D.B. Jacobs, Soodabeh Azadehranjbar, Ruikang Ding, Andrew Baker, Sai Bharadwaj Vishnubhotla, Ingrid Padilla Espinosa, Rimei Chen, Ashlie Martini |
| On-Site Speaker (Planned) |
Tevis D.B. Jacobs |
| Abstract Scope |
Nanoscale adhesion and deformation are controlled by atomic-scale processes. While scanning probes experiments measure forces precisely, fundamental understanding is typically precluded by a lack of knowledge of the shape and structure of the probe and the instantaneous nature of the contact. This talk will discuss recent progress in understanding the nature of adhesion and deformation by performing tests inside of a transmission electron microscope (TEM). The in situ TEM setup enables sub-nanonewton resolution of applied and adhesive forces, combined with Ångström-scale information about the bodies and their contact. This is coupled with electrical biasing to yield instantaneous contact conductance measurements with nanoamp-resolution. Furthermore, the knowledge of material shape, structure, and crystallographic orientation is used to generate precisely matched model tips that can be simulated using molecular dynamics. Results reveal the strong effect of composition, structure, surface chemistry, and applied stress on nanoscale adhesion and deformation. |
| Proceedings Inclusion? |
Planned: |
| Keywords |
Nanotechnology, Thin Films and Interfaces, |