About this Abstract |
Meeting |
2024 TMS Annual Meeting & Exhibition
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Symposium
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Fatigue in Materials: Fundamentals, Multiscale Characterizations and Computational Modeling
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Presentation Title |
Characterizing the Fatigue Behavior of Nanocrystalline Thin Films via Automated High-throughput In-situ SEM Testing |
Author(s) |
Alejandro Barrios, Cody Kunka, John Nogan, Khalid Hattar, Brad Boyce |
On-Site Speaker (Planned) |
Alejandro Barrios |
Abstract Scope |
This work investigates the fatigue behavior of nanocrystalline thin films via an advanced experimental methodology consisting of automated high-throughput in situ scanning electron microscope (SEM) testing. The methodology features the microfabrication of an integrated Si frame accommodating a number of samples that can be tested simultaneously and independently. The samples in the Si frame are then tested inside an SEM in an automated and high-throughput manner. As an initial demonstration of the methodology, the fatigue behavior of nanocrystalline Al thin films was characterized and compared to coarse grained Al. Results highlight the intrinsic stochasticity in fatigue behavior in nanocrystalline metals and the significant reduction in total testing time compared to traditional fatigue testing. The technique presented here can additionally be expanded to test different materials, geometries and loading modes. SNL is managed and operated by NTESS under DOE NNSA contract DE-NA0003525. |
Proceedings Inclusion? |
Planned: |