|About this Abstract
||2021 TMS Annual Meeting & Exhibition
||Characterization of Minerals, Metals and Materials 2021
||Synchrotron Based Extended X-ray Absorption Fine Structure Spectroscopic Analysis of Metallic Glasses
||Tolga Han Ulucan, İlkay Kalay, Yunus Kalay
|On-Site Speaker (Planned)
||Tolga Han Ulucan
The characterization of amorphous materials is quite challenging as compared to its crystalline counterpart, particularly at atomic scales. X-ray Absorption Fine Structure spectroscopy (XAFS) is one of the techniques used to reveal the local atomic structure of amorphous materials. In this study, we used extended X-ray absorption fine structure spectroscopy using synchrotron radiation to reveal the as-quenched and partially crystalline Al90Tb10 marginal glass-forming systems. High energy X-ray diffraction (HEXRD) and EXAFS data were then used for RMC modeling at atomic scales. RMC results were analyzed by Voronoi tessellation and cluster analysis. The average coordination number of Al around Tb and bond length between Al and Tb are found to be ≈ 15 and ≈ 3.1 Å respectively by both EXAFS and RMC modeling. EXAFS experimental procedures, transmission/ fluorescence modes, data processing, and extracting structural information will be discussed in detail.