|About this Abstract
||2021 TMS Annual Meeting & Exhibition
||Characterization of Minerals, Metals and Materials 2021
||Large-scale crystal orientation mapping by directional reflectance microscopy
||Matteo Seita, Xiaogang Wang, Mallory Wittwer
|On-Site Speaker (Planned)
We present a new, optical technique that provides rapid crystal orientation mapping capabilities over large areas. This technique—which we call directional reflectance microscopy (DRM)—relies on acquiring a series of optical micrographs of chemically etched polycrystals under different illumination angles. By correlating the directional reflectivity of the surface with the local etch-induced surface structure, DRM enables accurate and complete crystal orientation measurements in a manner analogous to the indexing of Kikuchi bands produced by electron backscatter diffraction. With the additional flexibility afforded by the simple equipment employed and the high measurement throughput, DRM is uniquely suited to characterize entire parts—such as multi-crystalline silicon solar cells and turbine blades—or to assess large-scale microstructure heterogeneity—such as that which is commonly found in additively manufactured materials.