| About this Abstract |
| Meeting |
2020 TMS Annual Meeting & Exhibition
|
| Symposium
|
Atom Probe Tomography for Advanced Characterization of Metals, Minerals and Materials III
|
| Presentation Title |
A Review of Atom Probe Tomography Technology: The Present and Future |
| Author(s) |
David J. Larson |
| On-Site Speaker (Planned) |
David J. Larson |
| Abstract Scope |
Over the past decade, the improvements in the capability of 3D nanoscale characterization using atom probe tomography (APT) have been remarkable. The advances have enabled analysis of material systems and structures far beyond the early limitations of APT to bulk metals. In addition, the maturation of FIB-based specimen preparation methods and the use of in-situ t-EBSD/STEM has made site-specific analyses truly routine. This presentation will provide an overview of the state-of-the-art hardware, software, and applications with a perspective on the performance needs of various selected applications. |
| Proceedings Inclusion? |
Planned: Supplemental Proceedings volume |