About this Abstract |
Meeting |
2020 TMS Annual Meeting & Exhibition
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Symposium
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Atom Probe Tomography for Advanced Characterization of Metals, Minerals and Materials III
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Presentation Title |
Nanoparticle Sample Preparation for Atom Probe Tomography: Chemical Fixation and Cryo-Fixation |
Author(s) |
Leigh T. Stephenson, Se-Ho Kim, Joohyun Lim, Olga Kasian, Pyuck-Pa Choi, Christina Scheu, Dierk Raabe, Baptiste Gault |
On-Site Speaker (Planned) |
Baptiste Gault |
Abstract Scope |
Controlling size, shape, and composition of nanoparticles is required to improve their physical properties. Dopants and impurities distribution may affect lattice strains, electronic band structure and eventually catalytic selectivity and activity of nanoparticles; therefore, three-dimensional sub-nanometer resolution elemental mapping is key. Atom probe tomography (APT) is an enabling characterization tool for mapping the elemental distribution in nanostructured materials due to its unique combination of three-dimensional (3D) capability, sub-nanometer spatial resolution, and ppm-level detection sensitivity. Herein, we discuss the development of specimens preparation techniques for freestanding nanoparticles using chemical fixation and cryo-fixation of TiO2 nanorods, MoS2 nanosheet, and Ag nanoparticle. Both methods developed yield reliable APT data for complex-structural nanoparticles and each fixation advantage and drawback will be discussed. |
Proceedings Inclusion? |
Planned: Supplemental Proceedings volume |