|About this Abstract
||MS&T23: Materials Science & Technology
||Grain Boundaries, Interfaces, and Surfaces: Fundamental Structure-Property-Performance Relationships
||Anisotropic Interface Motion in Polycrystalline Films
||Danny Hermawan, John Blendell, R. Edwin Garcia
|On-Site Speaker (Planned)
The ability to integrate fundamental physical science to rapidly tailor the microstructure of polycrystalline thin-films of emerging chemistries for novel semiconducting and energy applications is key to accelerate its fabrication, functionalities, and reliability. For example, N. Thangaraj and U. Dahmen [Mat. Res. Soc. Symp. Proc. 238:171-176,1992.], detailed the grain morphology of a <100> orientation, heteroepitaxial Al "maze" structure grown on a Si (111) substrate. The three-crystallographic orientation cellular network that develops results on grain structures and dihedral angles that differ from the traditional 120 degrees, and calls attention to the relationships between the surface energy anisotropy and the space of geometrical misorientation parameters that describe a grain boundary. In this presentation, a data-driven comparison between experimental, sharp, and diffuse interfacial models of grain growth was made to compare the observed tricrystal grain boundary network behavior to propose kinetic laws of motions akin to classic N-6 rule for polycrystals.