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Meeting 2020 TMS Annual Meeting & Exhibition
Symposium Mechanical Response of Materials Investigated through Novel In-situ Experiments and Modeling
Sponsorship TMS Structural Materials Division
TMS: Thin Films and Interfaces Committee
Organizer(s) Saurabh Puri, Microstructure Engineering
Amit Pandey, Ansys/Granta Design
Dhriti Bhattacharyya, Australian Nuclear Science and Technology Organization
Dongchan Jang, KAIST
Jagannathan Rajagopalan, Arizona State University
Josh Kacher, Georgia Institute of Technology
Minh-Son Pham, Imperial College London
Robert Wheeler, Microtesting Solutions LLC
Shailendra P. Joshi, University of Houston
Scope The focus of this symposium is to discuss current research and key developments in theory, computational and experimental methods to study and predict the mechanical properties of materials in application-orientated environments. These environments may include, but are not limited to high temperature, cryogenic temperature, electrical and magnetic field, gas, radiation, chemical, pressure extremes, and humidity. In-situ mechanical testing using SEM, TEM, AFM, Raman, synchrotron, X-ray, IR, and FTIR observation techniques during testing are becoming increasingly popular for studying mechanical behavior of materials. Many such techniques have been developed to probe material response to stimuli across nano- to macro-length scales. At the same time, significant progress has been made in the development of high fidelity models to analyze the behavior of materials at different spatial and temporal scales. The intent of the symposium is to provide a forum for researchers from national laboratories, academia, and industry to discuss research progress in the area of in operando and/or in-situ mechanical testing at small length scales, advances in computational approaches and most importantly, integration of experiments and modeling to accelerate the development and acceptance of innovative materials and testing techniques.

Topics include:
* Development of instruments and experimental methodology for in-situ techniques and/or testing at non-ambient temperatures and/or environments.
* Imaging, analytical and modeling techniques to correlate microstructure, defects, crystal orientation, and strain field with mechanical properties.
* Microstructural observations using in-situ techniques across length scales.
* Experimental characterization and multiscale modeling of deformation of high-temperature materials, high-strength materials, thin films, 1D, 2D, and other low-dimension nanostructures, and interfaces.
* Uncertainty quantification and quantitative validation of computational models.
Abstracts Due 07/01/2019
Proceedings Plan Planned: TMS Journal: JOM
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