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Meeting 2022 TMS Annual Meeting & Exhibition
Symposium 30 Years of Nanoindentation with the Oliver-Pharr Method and Beyond
Organizer(s) Verena Maier-Kiener, Montanuniversitaet Leoben
Benoit Merle, University Erlangen-Nuremberg (Fau)
Erik G. Herbert, Michigan Technological University
Samantha K. Lawrence, Los Alamos National Laboratory
Nigel Jennett, Coventry University
Scope The origin of nanoindentation can be traced to the 1980s with the development of the first instrumented hardness testers providing submicrometer accuracy. However, it took the 1992 seminal publication by W.C. Oliver and G.M. Pharr to effectively launch the field. Their novel data evaluation procedure, later dubbed the “Oliver-Pharr method”, has directly enabled numerous transformative research efforts in a diverse range of fields spanning materials science, geology, biology and medicine. Up to now, it remains indispensable for ensuring the service performance and lifetime of essential small components, such as thin films and coatings, electronic sensors and MEMS.
This symposium aims at bringing together the different generations of researchers, as well as the different fields and applications. It will highlight the amazing range of applications and the robustness of the Oliver-Pharr method. A mixture of well-established invited speakers and promising younger researchers will address how everything started, how nanoindentation is currently used, and what the future of small-scale mechanical testing might look like.

Topics of interest:
• General aspects of nanoindentation including historical background
• Nanoindentation in-method development, standardization
• New approaches towards data science
• Dynamic nanoindentation (CSM, CMX, dynamics….)
• Refinements in understanding
• Indentation Size Effects
• Thermally activated deformation behavior
• Extreme testing environments, e.g. high and low temperatures, irradiation, electrochemical or high strain rates
• Complex loading conditions, such as cyclic fatigue, fracture testing
• In-situ testing in SEM, TEM or synchrotron
• Stress-strain measurements, e.g. from spherical nanoindentation
• Structural and functional materials; thin films, metals, ceramics, amorphous & crystalline
• Soft and viscoelastic materials behavior
Abstracts Due 07/01/2021
Proceedings Plan Undecided
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