About this Abstract |
Meeting |
2022 TMS Annual Meeting & Exhibition
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Symposium
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30 Years of Nanoindentation with the Oliver-Pharr Method and Beyond
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Presentation Title |
A New Long-term Indentation Relaxation Method to Measure Creep Properties at the Micro-scale with Application to Fused Silica, PMMA and Amorphous Selenium |
Author(s) |
Paul Baral, Gaylord Guillonneau, Guillaume Kermouche, Jean-Michel Bergheau, Jean-Luc Loubet |
On-Site Speaker (Planned) |
Paul Baral |
Abstract Scope |
Nanoindentation test is of great interest to characterize small-scale creep behavior of materials, thus a large literature exists on the field. Based on our previous works, a new procedure is developed to measure strain rate sensitivity m and apparent activation volume V* using nanoindentation relaxation experiments. This procedure is based on the control of the dynamic contact stiffness as measured by the continuous stiffness measurement module. Load decrease is monitored while maintaining the contact stiffness constant. It allows for very stable measurements of load with increasing time (up to 10 hours). The load relaxation data are interpreted using an analogy to uniaxial tests in order to extract representative material's parameters. An excellent agreement with literature is found for a wide range of material going from polymer to metals. Nanoindentation relaxation experiment is proved to be an accurate procedure to extract viscoplastic parameters of materials under very low strain rates. |
Proceedings Inclusion? |
Planned: |
Keywords |
Characterization, Thin Films and Interfaces, |