|About this Abstract
||2020 TMS Annual Meeting & Exhibition
||Accelerated Materials Evaluation for Nuclear Applications Utilizing Irradiation and Integrated Modeling
||H-2: Characterization of Helium Implanted Single Crystal Titanium
||Sarah R. Stevenson, Mehdi Balooch, Andrew Scott, Peter Hosemann, Frances Allen, Saryu Fensin
|On-Site Speaker (Planned)
||Sarah R. Stevenson
Helium bubble development in materials due to plasma exposure or transmutation is an ongoing concern for the structural integrity of nuclear components. Numerous studies have been performed on a range of materials to analyze degradation phenomena involving helium bubbles. In this work, helium ion microscopy (HIM), featuring a nanometer-sized ion beam allowing precise local implantation of near-surface helium, was used to implant single crystal titanium samples of varying crystallographic orientations. For each sample, multiple implantations were performed using a range of doses and dose rates. The implantations were characterized using a multi-technique approach. The swelling and surface topography changes of the implanted areas were investigated by atomic force microscopy (AFM) with sub nanometer height resolution. Nano-indentation was used to determine the variation of local hardness and elastic modulus with depth. Transmission electron microscopy (TEM) allowed for the characterization of defects and bubble distributions.