About this Abstract |
Meeting |
MS&T21: Materials Science & Technology
|
Symposium
|
Integration between Modeling and Experiments for Crystalline Metals: From Atomistic to Macroscopic Scales III
|
Presentation Title |
Automated Laue Pattern Analysis for Bragg Coherent Diffraction Imaging |
Author(s) |
Yueheng Zhang, Anthony Rollett, Robert Suter |
On-Site Speaker (Planned) |
Yueheng Zhang |
Abstract Scope |
The 34-ID-C beamline at the APS has recently acquired the capability to conduct Laue diffraction, a technique in which a polychromatic X-ray source illuminates a crystal, causing multiple reflections to simultaneously fulfill the Bragg condition and casting a unique Laue pattern on a detector. By rastering this beam across a polycrystalline sample, Laue patterns can be collected from all grains in a region of interest. When many grains are illuminated at the same time, multiple Laue patterns appear on the detector, complicating the process of identifying and indexing the correct set of peaks. We demonstrate automated Laue pattern analysis for segregating overlapping Laue patterns by sorting peaks into groups based on the peaks center-of-mass, indexing all peaks in each separated group, and combining the results to build an orientation map of the microstructure. This tool will also allow us to intelligently conduct coherent X-ray diffraction experiments on grains of interest. |