About this Abstract |
Meeting |
2020 TMS Annual Meeting & Exhibition
|
Symposium
|
Aluminum Alloys, Processing and Characterization
|
Presentation Title |
F-22: Microstructure Analysis of Graded Interface Layers in a Model Multilayer Al/Al-Zn/Al by Scanning Microbeam Small-angle X-ray Scattering Measurements |
Author(s) |
Shan Lin, Hiroshi Okuda, Higashino Yukihiro, Katsushi Matsumoto, Kazufumi Sato |
On-Site Speaker (Planned) |
Shan Lin |
Abstract Scope |
The distribution of precipitation microstructures in the interdiffusion layer of a model multilayers of Al / Al-Zn alloy / Al with a total thickness of about 3 mm was examined using microbeam small-angle X-ray scattering (SAXS) measurements. The change of scattering profiles across the graded interfacial layers reflected the spatial change in the volume fraction, average size, and size distribution in the sample. Microstructural parameters obtained from the SAXS analysis explained the hardness change in the interface area. The present results suggest that small-angle scattering analysis using a scanning microbeam is a useful tool to examine the microstructural distribution and predict the properties of the interface region in multilayer composite sheets, in particular, the microstructure and properties of transient interfacial layers. Present work is based on results obtained from a project commissioned by the New Energy and Industrial Technology Development Organization (NEDO). |
Proceedings Inclusion? |
Planned: Light Metals |