|About this Abstract
||2020 TMS Annual Meeting & Exhibition
||Algorithm Development in Materials Science and Engineering
||Applying Machine Learning to Identifying Packing Defects in Amorphous Materials
||Tina Mirzaei, P.Alex Greaney
|On-Site Speaker (Planned)
We present machine learning algorithms for identifying the “defects” in amorphous materials — structures with local properties that are outliers in the property distribution and so represent sites of weakness. Several approaches are presented for quantifying local structure, and these are used in combination with principal component analysis and cluster analysis to identify defect types.
||Planned: Supplemental Proceedings volume