|About this Abstract
||2020 TMS Annual Meeting & Exhibition
||Algorithm Development in Materials Science and Engineering
||Real-time Analysis of Diffraction Data for Enabling In-situ Measurements
||Anup Pandey, John Andrew Redwig Catillo Castilo, Surya Khalidindi, Reeju Pokharel
|On-Site Speaker (Planned)
Macroscopic properties of materials are governed by the spatial distribution of microstructures. Recent advancements in experimental techniques such as electron backscatter diffraction (EBSD), high-energy X-ray diffraction microscopy (HEMD), etc. have enabled the characterization and evolution of microstructures with better resolution. Specifically, HEMD being non-destructive technique enables 3D microstructures characterization and allows one to probe material dynamics subjected to various thermo-mechanical conditions. However, these experimental techniques generate terabytes of data per sample. We have developed efficient methods in analyzing these large experimental datasets using state-of-the-art techniques based on artificial intelligence and diffraction simulations, thereby opening an avenue for real-time analysis of in-situ measurements.
||Planned: Supplemental Proceedings volume