| About this Abstract |
| Meeting |
MS&T21: Materials Science & Technology
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| Symposium
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Grain Boundaries, Interfaces, and Surfaces in Ceramics: Fundamental Structure—Property—Performance Relationships
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| Presentation Title |
P1-21: The Effect of High Energy Diffraction Microscopy (HEDM) and Laboratory Diffraction Contrast Tomography (LabDCT) Resolution on Measured Grain Growth Parameters in Strontium Titanate (SrTiO3). |
| Author(s) |
Vivekanand Muralikrishnan, Jette Oddershede, He Liu, Bryan Conry, Florian Bachmann, Robert Suter, Amanda Krause |
| On-Site Speaker (Planned) |
Vivekanand Muralikrishnan |
| Abstract Scope |
Non-destructive 3D x-ray diffraction microscopy (3DXRD) techniques provide an opportunity to track how individual grains and grain boundaries in a microstructure evolve over time to explore poorly understood grain growth phenomena. However, these 3D techniques have limited spatial resolution, which can impact the accuracy of the measured grain growth parameters. This study evaluates how differences in spatial resolution between easily accessible Laboratory-based Diffraction Contrast Tomography (LabDCT) (3µm) and limited access synchrotron-based High Energy X-Ray Diffraction Microscopy (HEDM) (2µm) impact the grain growth parameters, including grain size and grain boundary curvature. While differences in grain boundary location can affect parameters like curvature, we found that the general correlation between the grain growth parameters is similar in LabDCT and HEDM when statistically observed for all the grains in the microstructure. The implication of these results and the benefits and limitations of these techniques will be discussed. |