| About this Abstract |
| Meeting |
MS&T21: Materials Science & Technology
|
| Symposium
|
Grain Boundaries, Interfaces, and Surfaces in Ceramics: Fundamental Structure—Property—Performance Relationships
|
| Presentation Title |
3-D Quantification of Grain Boundary Defect Chemistry Using TEM + APT |
| Author(s) |
Brian P. Gorman |
| On-Site Speaker (Planned) |
Brian P. Gorman |
| Abstract Scope |
Recent work has shown that Atom Probe Tomography (APT) has the requisite counting statistics, 3-dimensionality, detectability limits, and spatial resolution to quantify point defect accumulations at grain boundaries in many ceramic systems. Combined with TEM and EELS, full quantification of the defect chemistry reactions is possible in 1 nm^3 volumes. APT has also enabled the conversion of defect accumulations directly to space charge voltages and band alignments. A direct relationship between characterization and grain boundary dominated properties can thus be achieved. Counting vacancies is heavily dependent upon the detection efficiency of the APT experiment that can vary between 15 and 80% and upon the volume being sampled. Detecting substitutional cations and defect pairs can be completed as long as the elements are distinguishable in the mass spectrum. Detecting Frenkel defects will have to wait for Atomic Scale Tomography, which has recently been proposed to be possible using TEM + APT. |